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Golden Member
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早就有了
Plextor和Benq用自家程式可以偵測TE/FE
TE(Tracking Error)雷射讀寫頭在空白片的循軌錯誤率
而FE(Focus Error)雷射讀取頭在空白片的聚焦錯誤率
TE/FE值愈小，意思就是變動程度越小
而TE/FE和燒錄完後的PIE/PIF有一定比例關係而已
不是完全正相關
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